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High Sensitivity HEH Monitor
The most critical failure mode of HV semiconductors exposed to radiation is Single Event Burnout (SEB). The probability of this catastrophic failure mode is strongly dependent on the applied bias voltage and is triggered by either heavy ions or High Energy Hadrons (HEH). The Large Hadron Collider (L...
| Autores principales: | , , |
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| Lenguaje: | eng |
| Publicado: |
2019
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/PPPS34859.2019.9009620 http://cds.cern.ch/record/2728005 |