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High Sensitivity HEH Monitor

The most critical failure mode of HV semiconductors exposed to radiation is Single Event Burnout (SEB). The probability of this catastrophic failure mode is strongly dependent on the applied bias voltage and is triggered by either heavy ions or High Energy Hadrons (HEH). The Large Hadron Collider (L...

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Detalles Bibliográficos
Autores principales:	Senaj, V, Pastor, D Cabrerizo, Kramer, T
Lenguaje:	eng
Publicado:	2019
Materias:	Accelerators and Storage Rings Detectors and Experimental Techniques
Acceso en línea:	https://dx.doi.org/10.1109/PPPS34859.2019.9009620 http://cds.cern.ch/record/2728005

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