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A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors

Single Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs temporally and spatially correlated with Timepix3 detectors. The Timepi...

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Detalles Bibliográficos
Autores principales: Broulim, J, Broulim, P, Campbell, M, Georgiev, V, Holik, M, Kunstmuller, P, Pavlicek, V, Pospisil, S, Vavroch, O, Vlasek, J, Zich, J
Lenguaje:eng
Publicado: 2020
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2020.164397
http://cds.cern.ch/record/2729061