A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors

Single Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs temporally and spatially correlated with Timepix3 detectors. The Timepi...

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Detalles Bibliográficos
Autores principales: Broulim, J, Broulim, P, Campbell, M, Georgiev, V, Holik, M, Kunstmuller, P, Pavlicek, V, Pospisil, S, Vavroch, O, Vlasek, J, Zich, J
Lenguaje:eng
Publicado: 2020
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2020.164397
http://cds.cern.ch/record/2729061
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author Broulim, J
Broulim, P
Campbell, M
Georgiev, V
Holik, M
Kunstmuller, P
Pavlicek, V
Pospisil, S
Vavroch, O
Vlasek, J
Zich, J
author_facet Broulim, J
Broulim, P
Campbell, M
Georgiev, V
Holik, M
Kunstmuller, P
Pavlicek, V
Pospisil, S
Vavroch, O
Vlasek, J
Zich, J
author_sort Broulim, J
collection CERN
description Single Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs temporally and spatially correlated with Timepix3 detectors. The Timepix detector is a semiconductor pixel detector, which contains 256 x 256 pixels. It provides energy or time information for each hit pixel. Our experimental setup consists of FPGA based board synchronized Timepix readout and a Device Under Test (DUT).
id oai-inspirehep.net-1811859
institution Organización Europea para la Investigación Nuclear
language eng
publishDate 2020
record_format invenio
spelling oai-inspirehep.net-18118592022-12-13T14:19:57Zdoi:10.1016/j.nima.2020.164397http://cds.cern.ch/record/2729061engBroulim, JBroulim, PCampbell, MGeorgiev, VHolik, MKunstmuller, PPavlicek, VPospisil, SVavroch, OVlasek, JZich, JA concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectorsDetectors and Experimental TechniquesSingle Event Effects (SEE), caused generally by single energetic particles, pose an important issue when implementing electronics in a harsh radiation environment. In this work, we present an electronic system for measuring SEEs temporally and spatially correlated with Timepix3 detectors. The Timepix detector is a semiconductor pixel detector, which contains 256 x 256 pixels. It provides energy or time information for each hit pixel. Our experimental setup consists of FPGA based board synchronized Timepix readout and a Device Under Test (DUT).oai:inspirehep.net:18118592020
spellingShingle Detectors and Experimental Techniques
Broulim, J
Broulim, P
Campbell, M
Georgiev, V
Holik, M
Kunstmuller, P
Pavlicek, V
Pospisil, S
Vavroch, O
Vlasek, J
Zich, J
A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors
title A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors
title_full A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors
title_fullStr A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors
title_full_unstemmed A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors
title_short A concept for spatially and time correlated single event effect detection in semiconductors using Timepix type pixel detectors
title_sort concept for spatially and time correlated single event effect detection in semiconductors using timepix type pixel detectors
topic Detectors and Experimental Techniques
url https://dx.doi.org/10.1016/j.nima.2020.164397
http://cds.cern.ch/record/2729061
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