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Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions

This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic. The radiation experiments were performed in the CERN North...

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Detalles Bibliográficos
Autores principales: Vlagkoulis, Vasileios, Sari, Aitzan, Vrachnis, John, Antonopoulos, Georgios, Segkos, Nikolaos, Psarakis, Mihalis, Tavoularis, Antonios, Furano, Gianluca, Polo, Cesar Boatella, Poivey, Christian, Ferlet-Cavrois, Veronique, Kastriotou, Maria, Fernandez Martinez, Pablo, Garcia Alia, Ruben, Voss, Kay-Obbe, Schuy, Christoph
Lenguaje:eng
Publicado: 2021
Materias:
Acceso en línea:https://dx.doi.org/10.1109/TNS.2020.3033188
http://cds.cern.ch/record/2751456