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Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions
This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic. The radiation experiments were performed in the CERN North...
| Autores principales: | , , , , , , , , , , , , , , , |
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| Lenguaje: | eng |
| Publicado: |
2021
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| Materias: | |
| Acceso en línea: | https://dx.doi.org/10.1109/TNS.2020.3033188 http://cds.cern.ch/record/2751456 |
| _version_ | 1780969234964152320 |
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| author | Vlagkoulis, Vasileios Sari, Aitzan Vrachnis, John Antonopoulos, Georgios Segkos, Nikolaos Psarakis, Mihalis Tavoularis, Antonios Furano, Gianluca Polo, Cesar Boatella Poivey, Christian Ferlet-Cavrois, Veronique Kastriotou, Maria Fernandez Martinez, Pablo Garcia Alia, Ruben Voss, Kay-Obbe Schuy, Christoph |
| author_facet | Vlagkoulis, Vasileios Sari, Aitzan Vrachnis, John Antonopoulos, Georgios Segkos, Nikolaos Psarakis, Mihalis Tavoularis, Antonios Furano, Gianluca Polo, Cesar Boatella Poivey, Christian Ferlet-Cavrois, Veronique Kastriotou, Maria Fernandez Martinez, Pablo Garcia Alia, Ruben Voss, Kay-Obbe Schuy, Christoph |
| author_sort | Vlagkoulis, Vasileios |
| collection | CERN |
| description | This article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic. The radiation experiments were performed in the CERN North Area facility and in the GSI Helmholtz Centre for Heavy Ion Research using very/ultra high-energy heavy ions. The offline analysis of the radiation experimental results produced a deep understanding for various SEE phenomena observed in the Zynq-7000 FPGAs, such as single-event function interrupts (SEFIs), single-event transient (SET) in global signals, and multiple bit upsets that could be key issues for the design of an effective SEE mitigation approach. |
| id | oai-inspirehep.net-1842593 |
| institution | Organización Europea para la Investigación Nuclear |
| language | eng |
| publishDate | 2021 |
| record_format | invenio |
| spelling | oai-inspirehep.net-18425932023-06-13T15:06:36Zdoi:10.1109/TNS.2020.3033188http://cds.cern.ch/record/2751456engVlagkoulis, VasileiosSari, AitzanVrachnis, JohnAntonopoulos, GeorgiosSegkos, NikolaosPsarakis, MihalisTavoularis, AntoniosFurano, GianlucaPolo, Cesar BoatellaPoivey, ChristianFerlet-Cavrois, VeroniqueKastriotou, MariaFernandez Martinez, PabloGarcia Alia, RubenVoss, Kay-ObbeSchuy, ChristophSingle Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy IonsDetectors and Experimental TechniquesThis article studies the impact of radiation-induced single-event effects (SEEs) in the Zynq-7000 field programmable gate array (FPGA) and presents an in-depth analysis of the SEE susceptibility of all the memories of the programmable logic. The radiation experiments were performed in the CERN North Area facility and in the GSI Helmholtz Centre for Heavy Ion Research using very/ultra high-energy heavy ions. The offline analysis of the radiation experimental results produced a deep understanding for various SEE phenomena observed in the Zynq-7000 FPGAs, such as single-event function interrupts (SEFIs), single-event transient (SET) in global signals, and multiple bit upsets that could be key issues for the design of an effective SEE mitigation approach.oai:inspirehep.net:18425932021 |
| spellingShingle | Detectors and Experimental Techniques Vlagkoulis, Vasileios Sari, Aitzan Vrachnis, John Antonopoulos, Georgios Segkos, Nikolaos Psarakis, Mihalis Tavoularis, Antonios Furano, Gianluca Polo, Cesar Boatella Poivey, Christian Ferlet-Cavrois, Veronique Kastriotou, Maria Fernandez Martinez, Pablo Garcia Alia, Ruben Voss, Kay-Obbe Schuy, Christoph Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions |
| title | Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions |
| title_full | Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions |
| title_fullStr | Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions |
| title_full_unstemmed | Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions |
| title_short | Single Event Effects Characterization of the Programmable Logic of Xilinx Zynq-7000 FPGA Using Very/Ultra High-Energy Heavy Ions |
| title_sort | single event effects characterization of the programmable logic of xilinx zynq-7000 fpga using very/ultra high-energy heavy ions |
| topic | Detectors and Experimental Techniques |
| url | https://dx.doi.org/10.1109/TNS.2020.3033188 http://cds.cern.ch/record/2751456 |
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