Assessment of Proton Direct Ionization for the Radiation Hardness Assurance of Deep Submicron SRAMs Used in Space Applications

Detalles Bibliográficos
Autores principales: Coronetti, Andrea, Alia, Ruben Garcia, Wang, Jialei, Tali, Maris, Cecchetto, Matteo, Cazzaniga, Carlo, Javanainen, Arto, Saigne, Frederic, Leroux, Paul
Lenguaje:eng
Publicado: 2021
Materias:
Detectors and Experimental Techniques
Acceso en línea:https://dx.doi.org/10.1109/tns.2021.3061209
http://cds.cern.ch/record/2772978

Internet

https://dx.doi.org/10.1109/tns.2021.3061209
http://cds.cern.ch/record/2772978

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