Measurement of trapping time constants in proton-irradiated silicon pad detectors

Silicon pad-detectors fabricated from oxygenated silicon were irradiated with 24-GeV/c protons with fluences between $2 \cdot 10^{13} \ n_{\rm{eq}}/\rm{cm}^2$ and $9 \cdot 10^{14} \ n_{\rm{eq}}/\rm{cm}^2$. The transient current technique was used to measure the trapping probability for holes and electrons. The measured trapping probabilities scale linearly with the fluence. Annealing, accelerated at 60°C, leads to an increased trapping for holes while electron trapping decreases.