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Numerical analysis of thinned silicon detectors

In the framework of the CERN-RD50 and INFN-SMART collaboration, we have investigated the possibility of using thin devices as a solution to improve the reliability of silicon detectors after long-term irradiation at the Super-Large Hadron Collider (LHC). In this work, we compare conventional silicon...

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Detalles Bibliográficos
Autores principales: Petasecca, M, Pignatel, G U, Moscatelli, F, Passeri, D, Caprai, G
Lenguaje:eng
Publicado: 2007
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2006.10.373
http://cds.cern.ch/record/2635048