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CCE measurements on heavily irradiated micro-strip sensors

The paper describes a study of the radiation hardness of micro-strip devices, processed on different silicon substrates, designed to explore the feasibility of a tracker system for the experiments upgrade at the Super-LHC (S-LHC) collider. The radiation tolerance of the devices has been established...

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Detalles Bibliográficos
Autores principales: Bernardini, J, Borrello, L, Fiori, F, Messineo, A
Lenguaje:eng
Publicado: 2010
Materias:
Acceso en línea:https://dx.doi.org/10.1016/j.nima.2009.08.007
http://cds.cern.ch/record/2634861