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CCE measurements on heavily irradiated micro-strip sensors
The paper describes a study of the radiation hardness of micro-strip devices, processed on different silicon substrates, designed to explore the feasibility of a tracker system for the experiments upgrade at the Super-LHC (S-LHC) collider. The radiation tolerance of the devices has been established...
Autores principales: | Bernardini, J, Borrello, L, Fiori, F, Messineo, A |
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Lenguaje: | eng |
Publicado: |
2010
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Materias: | |
Acceso en línea: | https://dx.doi.org/10.1016/j.nima.2009.08.007 http://cds.cern.ch/record/2634861 |
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