Metric behavior of patent granted in Cuba: its contribution to the national technological innovation

Metric patent studies since the end of the last century are a valuable tool for scientific technological and innovation surveillance, becoming an indispensable instrument for knowing the international technological behavior. However, patentometric studies are not applied optimally by all countries o...

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Detalles Bibliográficos
Autores principales: Díaz Pérez, Maidelyn, Giráldez Reyes, Raudel, Carrillo-Calvet, Humberto Andrés
Formato: Online Artículo
Lenguaje:spa
Publicado: Instituto de Investigaciones Bibliotecológicas y de la Información 2018
Materias:
estudio patentométrico de innovaciones tecnológicas
redes de dominios tecnológicos
indicadores de colaboración tecnológica
Patentometric studies of technological innovations
Technological domain networks
Technological collaboration indicators
Acceso en línea:http://rev-ib.unam.mx/ib/index.php/ib/article/view/57893
https://dx.doi.org/10.22201/iibi.24488321xe.2017.nesp1.57893

Internet

http://rev-ib.unam.mx/ib/index.php/ib/article/view/57893
https://dx.doi.org/10.22201/iibi.24488321xe.2017.nesp1.57893

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