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Metric behavior of patent granted in Cuba: its contribution to the national technological innovation
Metric patent studies since the end of the last century are a valuable tool for scientific technological and innovation surveillance, becoming an indispensable instrument for knowing the international technological behavior. However, patentometric studies are not applied optimally by all countries o...
| Autores principales: | , , |
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| Formato: | Online Artículo |
| Lenguaje: | spa |
| Publicado: |
Instituto de Investigaciones Bibliotecológicas y de la Información
2018
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| Materias: | |
| Acceso en línea: | http://rev-ib.unam.mx/ib/index.php/ib/article/view/57893 https://dx.doi.org/10.22201/iibi.24488321xe.2017.nesp1.57893 |