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In Situ Synchrotron XRD Characterization of Piezoelectric Al(1−x)Sc(x)N Thin Films for MEMS Applications
Aluminum scandium nitride (Al(1−x)Sc(x)N) film has drawn considerable attention owing to its enhanced piezoelectric response for micro-electromechanical system (MEMS) applications. Understanding the fundamentals of piezoelectricity would require a precise characterization of the piezoelectric coeffi...
Autores principales: | Jiang, Wenzheng, Zhu, Lei, Chen, Lingli, Yang, Yumeng, Yu, Xi, Li, Xiaolong, Mu, Zhiqiang, Yu, Wenjie |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10004546/ https://www.ncbi.nlm.nih.gov/pubmed/36902897 http://dx.doi.org/10.3390/ma16051781 |
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