Preparation of Discontinuous Cu/SiO(2) Multilayers—AC Conduction and Determining the Measurement Uncertainty

This paper presents a test stand for testing alternating current electrical parameters of Cu–SiO(2) multilayer nanocomposite structures obtained by the dual-source non-reactive magnetron sputtering method (resistance, capacitance, phase shift angle, and dielectric loss angle tangent δ). In order to...

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Detalles Bibliográficos
Autores principales: Wilczyńska, Aleksandra, Kociubiński, Andrzej, Kołtunowicz, Tomasz N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10007221/
https://www.ncbi.nlm.nih.gov/pubmed/36905046
http://dx.doi.org/10.3390/s23052842

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10007221/
https://www.ncbi.nlm.nih.gov/pubmed/36905046
http://dx.doi.org/10.3390/s23052842

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