Corrigendum to ‘Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test’; Information Processing & Management 59 (2022) 103093 /6

Detalles Bibliográficos
Autores principales: Kim, Se Young, Park, Hahyeon, Kim, Hongbum, Kim, Joon, Seo, Kyoungwon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Author(s). Published by Elsevier Ltd. 2023
Materias:
Corrigendum
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10017303/
https://www.ncbi.nlm.nih.gov/pubmed/37293259
http://dx.doi.org/10.1016/j.ipm.2023.103346

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10017303/
https://www.ncbi.nlm.nih.gov/pubmed/37293259
http://dx.doi.org/10.1016/j.ipm.2023.103346

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