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Corrigendum to ‘Technostress causes cognitive overload in high-stress people: Eye tracking analysis in a virtual kiosk test’; Information Processing & Management 59 (2022) 103093 /6
Autores principales: | Kim, Se Young, Park, Hahyeon, Kim, Hongbum, Kim, Joon, Seo, Kyoungwon |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
The Author(s). Published by Elsevier Ltd.
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10017303/ https://www.ncbi.nlm.nih.gov/pubmed/37293259 http://dx.doi.org/10.1016/j.ipm.2023.103346 |
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