Electrically Driven Plasmons in Metal–Insulator–Semiconductor Tunnel Junctions: The Role of Silicon Amorphization

[Image: see text] We investigate electrically driven plasmon (EDP) emission in metal–insulator–semiconductor tunnel junctions. We find that amorphization of the silicon crystal at a narrow region near the junction due to the applied voltage plays a critical role in determining the nature of the emis...

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Detalles Bibliográficos
Autores principales: Erez-Cohen, Omer, Brontvein, Olga, Bar-Joseph, Israel
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10037326/
https://www.ncbi.nlm.nih.gov/pubmed/36856602
http://dx.doi.org/10.1021/acs.nanolett.2c04863

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10037326/
https://www.ncbi.nlm.nih.gov/pubmed/36856602
http://dx.doi.org/10.1021/acs.nanolett.2c04863

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