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Electrically Driven Plasmons in Metal–Insulator–Semiconductor Tunnel Junctions: The Role of Silicon Amorphization
[Image: see text] We investigate electrically driven plasmon (EDP) emission in metal–insulator–semiconductor tunnel junctions. We find that amorphization of the silicon crystal at a narrow region near the junction due to the applied voltage plays a critical role in determining the nature of the emis...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10037326/ https://www.ncbi.nlm.nih.gov/pubmed/36856602 http://dx.doi.org/10.1021/acs.nanolett.2c04863 |