Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence

[Image: see text] Time-resolved analysis of photon cross-correlation function g((2))(τ) is applied to photoluminescence (PL) of individual submicrometer size MAPbI(3) perovskite crystals. Surprisingly, an antibunching effect in the long-living tail of PL is observed, while the prompt PL obeys the ph...

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Detalles Bibliográficos
Autores principales: Eremchev, Ivan Yu., Tarasevich, Aleksandr O., Kniazeva, Maria A., Li, Jun, Naumov, Andrei V., Scheblykin, Ivan G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10037414/
https://www.ncbi.nlm.nih.gov/pubmed/36893363
http://dx.doi.org/10.1021/acs.nanolett.2c04004

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10037414/
https://www.ncbi.nlm.nih.gov/pubmed/36893363
http://dx.doi.org/10.1021/acs.nanolett.2c04004

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