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Detection of Single Charge Trapping Defects in Semiconductor Particles by Evaluating Photon Antibunching in Delayed Photoluminescence
[Image: see text] Time-resolved analysis of photon cross-correlation function g((2))(τ) is applied to photoluminescence (PL) of individual submicrometer size MAPbI(3) perovskite crystals. Surprisingly, an antibunching effect in the long-living tail of PL is observed, while the prompt PL obeys the ph...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10037414/ https://www.ncbi.nlm.nih.gov/pubmed/36893363 http://dx.doi.org/10.1021/acs.nanolett.2c04004 |