Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach

Failure analysis has become an important part of guaranteeing good quality in the electronic component manufacturing process. The conclusions of a failure analysis can be used to identify a component’s flaws and to better understand the mechanisms and causes of failure, allowing for the implementati...

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Detalles Bibliográficos
Autores principales: Rammal, Abbas, Ezukwoke, Kenneth, Hoayek, Anis, Batton-Hubert, Mireille
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10043275/
https://www.ncbi.nlm.nih.gov/pubmed/36973298
http://dx.doi.org/10.1038/s41598-023-30769-8

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10043275/
https://www.ncbi.nlm.nih.gov/pubmed/36973298
http://dx.doi.org/10.1038/s41598-023-30769-8

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