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Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach

Failure analysis has become an important part of guaranteeing good quality in the electronic component manufacturing process. The conclusions of a failure analysis can be used to identify a component’s flaws and to better understand the mechanisms and causes of failure, allowing for the implementati...

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Autores principales: Rammal, Abbas, Ezukwoke, Kenneth, Hoayek, Anis, Batton-Hubert, Mireille
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10043275/
https://www.ncbi.nlm.nih.gov/pubmed/36973298
http://dx.doi.org/10.1038/s41598-023-30769-8
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author Rammal, Abbas
Ezukwoke, Kenneth
Hoayek, Anis
Batton-Hubert, Mireille
author_facet Rammal, Abbas
Ezukwoke, Kenneth
Hoayek, Anis
Batton-Hubert, Mireille
author_sort Rammal, Abbas
collection PubMed
description Failure analysis has become an important part of guaranteeing good quality in the electronic component manufacturing process. The conclusions of a failure analysis can be used to identify a component’s flaws and to better understand the mechanisms and causes of failure, allowing for the implementation of remedial steps to improve the product’s quality and reliability. A failure reporting, analysis, and corrective action system is a method for organizations to report, classify, and evaluate failures, as well as plan corrective actions. These text feature datasets must first be preprocessed by Natural Language Processing techniques and converted to numeric by vectorization methods before starting the process of information extraction and building predictive models to predict failure conclusions of a given failure description. However, not all-textual information is useful for building predictive models suitable for failure analysis. Feature selection has been approached by several variable selection methods. Some of them have not been adapted for use in large data sets or are difficult to tune and others are not applicable to textual data. This article aims to develop a predictive model able to predict the failure conclusions using the discriminating features of the failure descriptions. For this, we propose to combine a Genetic Algorithm with supervised learning methods for an optimal prediction of the conclusions of failure in terms of the discriminant features of failure descriptions. Since we have an unbalanced dataset, we propose to apply an F1 score as a fitness function of supervised classification methods such as Decision Tree Classifier and Support Vector Machine. The suggested algorithms are called GA-DT and GA-SVM. Experiments on failure analysis textual datasets demonstrate the effectiveness of the proposed GA-DT method in creating a better predictive model of failure conclusion compared to using the information of the entire textual features or limited features selected by a genetic algorithm based on a SVM. Quantitative performances such as BLEU score and cosine similarity are used to compare the prediction performance of the different approaches.
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spelling pubmed-100432752023-03-29 Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach Rammal, Abbas Ezukwoke, Kenneth Hoayek, Anis Batton-Hubert, Mireille Sci Rep Article Failure analysis has become an important part of guaranteeing good quality in the electronic component manufacturing process. The conclusions of a failure analysis can be used to identify a component’s flaws and to better understand the mechanisms and causes of failure, allowing for the implementation of remedial steps to improve the product’s quality and reliability. A failure reporting, analysis, and corrective action system is a method for organizations to report, classify, and evaluate failures, as well as plan corrective actions. These text feature datasets must first be preprocessed by Natural Language Processing techniques and converted to numeric by vectorization methods before starting the process of information extraction and building predictive models to predict failure conclusions of a given failure description. However, not all-textual information is useful for building predictive models suitable for failure analysis. Feature selection has been approached by several variable selection methods. Some of them have not been adapted for use in large data sets or are difficult to tune and others are not applicable to textual data. This article aims to develop a predictive model able to predict the failure conclusions using the discriminating features of the failure descriptions. For this, we propose to combine a Genetic Algorithm with supervised learning methods for an optimal prediction of the conclusions of failure in terms of the discriminant features of failure descriptions. Since we have an unbalanced dataset, we propose to apply an F1 score as a fitness function of supervised classification methods such as Decision Tree Classifier and Support Vector Machine. The suggested algorithms are called GA-DT and GA-SVM. Experiments on failure analysis textual datasets demonstrate the effectiveness of the proposed GA-DT method in creating a better predictive model of failure conclusion compared to using the information of the entire textual features or limited features selected by a genetic algorithm based on a SVM. Quantitative performances such as BLEU score and cosine similarity are used to compare the prediction performance of the different approaches. Nature Publishing Group UK 2023-03-27 /pmc/articles/PMC10043275/ /pubmed/36973298 http://dx.doi.org/10.1038/s41598-023-30769-8 Text en © The Author(s) 2023 https://creativecommons.org/licenses/by/4.0/Open AccessThis article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. The images or other third party material in this article are included in the article's Creative Commons licence, unless indicated otherwise in a credit line to the material. If material is not included in the article's Creative Commons licence and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this licence, visit http://creativecommons.org/licenses/by/4.0/ (https://creativecommons.org/licenses/by/4.0/) .
spellingShingle Article
Rammal, Abbas
Ezukwoke, Kenneth
Hoayek, Anis
Batton-Hubert, Mireille
Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach
title Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach
title_full Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach
title_fullStr Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach
title_full_unstemmed Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach
title_short Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach
title_sort root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10043275/
https://www.ncbi.nlm.nih.gov/pubmed/36973298
http://dx.doi.org/10.1038/s41598-023-30769-8
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