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Root cause prediction for failures in semiconductor industry, a genetic algorithm–machine learning approach
Failure analysis has become an important part of guaranteeing good quality in the electronic component manufacturing process. The conclusions of a failure analysis can be used to identify a component’s flaws and to better understand the mechanisms and causes of failure, allowing for the implementati...
| Autores principales: | , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10043275/ https://www.ncbi.nlm.nih.gov/pubmed/36973298 http://dx.doi.org/10.1038/s41598-023-30769-8 |