Tackling the Challenging Determination of Trace Elements in Ultrapure Silicon Carbide by LA-ICP-MS

The goal of accurately quantifying trace elements in ultrapure silicon carbide (SiC) with a purity target of 5N (99.999% purity) was addressed. The unsuitability of microwave-assisted acid digestion followed by Inductively Coupled Plasma Mass Spectrometry (ICP-MS) analysis was proved to depend mainl...

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Detalles Bibliográficos
Autores principales: Spanu, Davide, Palestra, Alessandro, Prina, Veronica, Monticelli, Damiano, Bonanomi, Simone, Nanot, Sandro Usseglio, Binda, Gilberto, Rampazzi, Laura, Sessa, Gianluca, Callejo Munoz, David, Recchia, Sandro
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10051955/
https://www.ncbi.nlm.nih.gov/pubmed/36985816
http://dx.doi.org/10.3390/molecules28062845

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10051955/
https://www.ncbi.nlm.nih.gov/pubmed/36985816
http://dx.doi.org/10.3390/molecules28062845

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