Towards Digital Twin Implementation in Roll-To-Roll Gravure Printed Electronics: Overlay Printing Registration Error Prediction Based on Printing Process Parameters

Roll-to-roll gravure (R2Rg) has become highly affiliated with printed electronics in the past few years due to its high yield of printed thin-film transistor (TFT) in active matrix devices, and to its low cost. For printing TFTs with multilayer structures, achieving a high-precision in overlay print...

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Detalles Bibliográficos
Autores principales: Shakeel, Anood, Maskey, Bijendra Bishow, Shrestha, Sagar, Parajuli, Sajjan, Jung, Younsu, Cho, Gyoujin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10053699/
https://www.ncbi.nlm.nih.gov/pubmed/36985902
http://dx.doi.org/10.3390/nano13061008

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10053699/
https://www.ncbi.nlm.nih.gov/pubmed/36985902
http://dx.doi.org/10.3390/nano13061008

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