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Towards Digital Twin Implementation in Roll-To-Roll Gravure Printed Electronics: Overlay Printing Registration Error Prediction Based on Printing Process Parameters
Roll-to-roll gravure (R2Rg) has become highly affiliated with printed electronics in the past few years due to its high yield of printed thin-film transistor (TFT) in active matrix devices, and to its low cost. For printing TFTs with multilayer structures, achieving a high-precision in overlay print...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10053699/ https://www.ncbi.nlm.nih.gov/pubmed/36985902 http://dx.doi.org/10.3390/nano13061008 |