Strain Measurement in Single Crystals by 4D-ED

A new method is presented to measure strain over a large area of a single crystal. The 4D-ED data are collected by recording a 2D diffraction pattern at each position in the 2D area of the TEM lamella scanned by the electron beam of STEM. Data processing is completed with a new computer program (ava...

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Detalles Bibliográficos
Autores principales: Lábár, János L., Pécz, Béla, van Waveren, Aiken, Hallais, Géraldine, Desvignes, Léonard, Chiodi, Francesca
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10054437/
https://www.ncbi.nlm.nih.gov/pubmed/36985899
http://dx.doi.org/10.3390/nano13061007

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10054437/
https://www.ncbi.nlm.nih.gov/pubmed/36985899
http://dx.doi.org/10.3390/nano13061007

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