Study on ESD Protection Circuit by TCAD Simulation and TLP Experiment

The anti-ESD characteristic of the electronic system is paid more and more attention. Moreover, the on-chip electrostatic discharge (ESD) is necessary for integrated circuits to prevent ESD failures. In this paper, the mixed TCAD model of the ESD protection circuit is built and simulated, and the ne...

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Detalles Bibliográficos
Autores principales: Li, Fuxing, Chai, Changchun, Liu, Yuqian, Song, Yanxing, Wang, Lei, Yang, Yintang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10055864/
https://www.ncbi.nlm.nih.gov/pubmed/36985006
http://dx.doi.org/10.3390/mi14030600

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10055864/
https://www.ncbi.nlm.nih.gov/pubmed/36985006
http://dx.doi.org/10.3390/mi14030600

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