Prediction of Single-Event Effects in FDSOI Devices Based on Deep Learning

Single-event effects (SEE) are an important index of radiation resistance for fully depleted silicon on insulator (FDSOI) devices. The research into traditional FDSOI devices is based on simulation software, which is time consuming, requires a large amount of calculation, and has complex operations....

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Detalles Bibliográficos
Autores principales: Zhao, Rong, Wang, Shulong, Du, Shougang, Pan, Jinbin, Ma, Lan, Chen, Shupeng, Liu, Hongxia, Chen, Yilei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10058389/
https://www.ncbi.nlm.nih.gov/pubmed/36984911
http://dx.doi.org/10.3390/mi14030502

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10058389/
https://www.ncbi.nlm.nih.gov/pubmed/36984911
http://dx.doi.org/10.3390/mi14030502

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