Genetic analysis and mapping of dwarf gene without yield penalty in a γ-ray-induced wheat mutant

Plant height is one of the most important agronomic traits that affects yield in wheat, owing to that the utilization of dwarf or semi-dwarf genes is closely associated with lodging resistance. In this study, we identified a semi-dwarf mutant, jg0030, induced by γ-ray mutagenesis of the wheat variet...

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Detalles Bibliográficos
Autores principales: Wang, Qingguo, Xiong, Hongchun, Guo, Huijun, Zhao, Linshu, Xie, Yongdun, Gu, Jiayu, Zhao, Shirong, Ding, Yuping, Liu, Luxiang
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2023
Materias:
Plant Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10074482/
https://www.ncbi.nlm.nih.gov/pubmed/37035057
http://dx.doi.org/10.3389/fpls.2023.1133024

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10074482/
https://www.ncbi.nlm.nih.gov/pubmed/37035057
http://dx.doi.org/10.3389/fpls.2023.1133024

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