Low‐energy electron microscopy intensity–voltage data – Factorization, sparse sampling and classification

Low‐energy electron microscopy (LEEM) taken as intensity–voltage (I–V) curves provides hyperspectral images of surfaces, which can be used to identify the surface type, but are difficult to analyse. Here, we demonstrate the use of an algorithm for factorizing the data into spectra and concentrations...

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Detalles Bibliográficos
Autores principales: Masia, Francesco, Langbein, Wolfgang, Fischer, Simon, Krisponeit, Jon‐Olaf, Falta, Jens
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2022
Materias:
Original Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10108219/
https://www.ncbi.nlm.nih.gov/pubmed/36288376
http://dx.doi.org/10.1111/jmi.13155

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10108219/
https://www.ncbi.nlm.nih.gov/pubmed/36288376
http://dx.doi.org/10.1111/jmi.13155

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