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Low‐energy electron microscopy intensity–voltage data – Factorization, sparse sampling and classification
Low‐energy electron microscopy (LEEM) taken as intensity–voltage (I–V) curves provides hyperspectral images of surfaces, which can be used to identify the surface type, but are difficult to analyse. Here, we demonstrate the use of an algorithm for factorizing the data into spectra and concentrations...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
John Wiley and Sons Inc.
2022
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10108219/ https://www.ncbi.nlm.nih.gov/pubmed/36288376 http://dx.doi.org/10.1111/jmi.13155 |