Updating the relationship of the Ne/ERN to task-related behavior: A brief review and suggestions for future research

The error negativity/error-related negativity (Ne/ERN) is one of the most well-studied event-related potential (ERP) components in the electroencephalography (EEG) literature. Peaking about 50 ms after the commission of an error, the Ne/ERN is a negative deflection in the ERP waveform that is though...

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Detalles Bibliográficos
Autores principales: LoTemplio, Sara B., Lopes, Clara Louise, McDonnell, Amy S., Scott, Emily E., Payne, Brennan R., Strayer, David L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2023
Materias:
Neuroscience
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10110987/
https://www.ncbi.nlm.nih.gov/pubmed/37082151
http://dx.doi.org/10.3389/fnhum.2023.1150244

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10110987/
https://www.ncbi.nlm.nih.gov/pubmed/37082151
http://dx.doi.org/10.3389/fnhum.2023.1150244

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