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Updating the relationship of the Ne/ERN to task-related behavior: A brief review and suggestions for future research
The error negativity/error-related negativity (Ne/ERN) is one of the most well-studied event-related potential (ERP) components in the electroencephalography (EEG) literature. Peaking about 50 ms after the commission of an error, the Ne/ERN is a negative deflection in the ERP waveform that is though...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Frontiers Media S.A.
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10110987/ https://www.ncbi.nlm.nih.gov/pubmed/37082151 http://dx.doi.org/10.3389/fnhum.2023.1150244 |