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Holistic Variability Analysis in Resistive Switching Memories Using a Two-Dimensional Variability Coefficient
[Image: see text] We present a new methodology to quantify the variability of resistive switching memories. Instead of statistically analyzing few data points extracted from current versus voltage (I–V) plots, such as switching voltages or state resistances, we take into account the whole I–V curve...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Chemical Society
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10119851/ https://www.ncbi.nlm.nih.gov/pubmed/37027783 http://dx.doi.org/10.1021/acsami.2c22617 |