A Method for Spatially Registered Microprofilometry Combining Intensity-Height Datasets from Interferometric Sensors

A recognized problem in profilometry applied to artworks is the spatial referencing of the surface topography at micrometer scale due to the lack of references in the height data with respect to the “visually readable” surface. We demonstrate a novel workflow for spatially referenced microprofilomet...

Descripción completa

Detalles Bibliográficos
Autores principales: Mazzocato, Sara, Daffara, Claudia
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10146856/
https://www.ncbi.nlm.nih.gov/pubmed/37112485
http://dx.doi.org/10.3390/s23084144

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10146856/
https://www.ncbi.nlm.nih.gov/pubmed/37112485
http://dx.doi.org/10.3390/s23084144

Ejemplares similares