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A Method for Spatially Registered Microprofilometry Combining Intensity-Height Datasets from Interferometric Sensors
A recognized problem in profilometry applied to artworks is the spatial referencing of the surface topography at micrometer scale due to the lack of references in the height data with respect to the “visually readable” surface. We demonstrate a novel workflow for spatially referenced microprofilomet...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10146856/ https://www.ncbi.nlm.nih.gov/pubmed/37112485 http://dx.doi.org/10.3390/s23084144 |