Solid Platinum Nanoprobes for Highly Reliable Conductive Atomic Force Microscopy

[Image: see text] Conductive atomic force microscopy (CAFM) is a powerful technique to investigate electrical and mechanical properties of materials and devices at the nanoscale. However, its main challenge is the reliability of the probe tips and their interaction with the samples. The most common...

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Detalles Bibliográficos
Autores principales: Weber, Jonas, Yuan, Yue, Kühnel, Fabian, Metzke, Christoph, Schätz, Josef, Frammelsberger, Werner, Benstetter, Günther, Lanza, Mario
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2023
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10165598/
https://www.ncbi.nlm.nih.gov/pubmed/37083396
http://dx.doi.org/10.1021/acsami.3c01102

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10165598/
https://www.ncbi.nlm.nih.gov/pubmed/37083396
http://dx.doi.org/10.1021/acsami.3c01102

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