A Fast Loss Model for Cascode GaN-FETs and Real-Time Degradation-Sensitive Control of Solid-State Transformers

This paper proposes a novel, degradation-sensitive, adaptive SST controller for cascode GaN-FETs. Unlike in traditional transformers, a semiconductor switch’s degradation and failure can compromise its robustness and integrity. It is vital to continuously monitor a switch’s health condition to adapt...

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Detalles Bibliográficos
Autores principales: Haque, Moinul Shahidul, Moniruzzaman, Md, Choi, Seungdeog, Kwak, Sangshin, Okilly, Ahmed H., Baek, Jeihoon
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10181594/
https://www.ncbi.nlm.nih.gov/pubmed/37177599
http://dx.doi.org/10.3390/s23094395

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10181594/
https://www.ncbi.nlm.nih.gov/pubmed/37177599
http://dx.doi.org/10.3390/s23094395

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