Advanced In Situ TEM Microchip with Excellent Temperature Uniformity and High Spatial Resolution

Transmission electron microscopy (TEM) is a highly effective method for scientific research, providing comprehensive analysis and characterization. However, traditional TEM is limited to observing static material structures at room temperature within a high-vacuum environment. To address this limita...

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Detalles Bibliográficos
Autores principales: Zhang, Xuelin, Zhou, Yufan, Chen, Ying, Li, Ming, Yu, Haitao, Li, Xinxin
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10181734/
https://www.ncbi.nlm.nih.gov/pubmed/37177673
http://dx.doi.org/10.3390/s23094470

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10181734/
https://www.ncbi.nlm.nih.gov/pubmed/37177673
http://dx.doi.org/10.3390/s23094470

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