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Advanced In Situ TEM Microchip with Excellent Temperature Uniformity and High Spatial Resolution
Transmission electron microscopy (TEM) is a highly effective method for scientific research, providing comprehensive analysis and characterization. However, traditional TEM is limited to observing static material structures at room temperature within a high-vacuum environment. To address this limita...
| Autores principales: | , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10181734/ https://www.ncbi.nlm.nih.gov/pubmed/37177673 http://dx.doi.org/10.3390/s23094470 |