Exploring the association between EEG microstates during resting-state and error-related activity in young children

The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error proc...

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Detalles Bibliográficos
Autores principales: Bagdasarov, Armen, Roberts, Kenneth, Brunet, Denis, Michel, Christoph M., Gaffrey, Michael S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Journal Experts 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10187414/
https://www.ncbi.nlm.nih.gov/pubmed/37205415
http://dx.doi.org/10.21203/rs.3.rs-2865543/v1

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10187414/
https://www.ncbi.nlm.nih.gov/pubmed/37205415
http://dx.doi.org/10.21203/rs.3.rs-2865543/v1

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