Cargando…

Exploring the association between EEG microstates during resting-state and error-related activity in young children

The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error proc...

Descripción completa

Detalles Bibliográficos
Autores principales: Bagdasarov, Armen, Roberts, Kenneth, Brunet, Denis, Michel, Christoph M., Gaffrey, Michael S.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Journal Experts 2023
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10187414/
https://www.ncbi.nlm.nih.gov/pubmed/37205415
http://dx.doi.org/10.21203/rs.3.rs-2865543/v1
_version_ 1785042732473909248
author Bagdasarov, Armen
Roberts, Kenneth
Brunet, Denis
Michel, Christoph M.
Gaffrey, Michael S.
author_facet Bagdasarov, Armen
Roberts, Kenneth
Brunet, Denis
Michel, Christoph M.
Gaffrey, Michael S.
author_sort Bagdasarov, Armen
collection PubMed
description The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error processing during early childhood is unclear. We examined the relationship between the ERN and EEG microstates – whole-brain patterns of dynamically evolving scalp potential topographies that reflect periods of synchronized neural activity – during both a go/no-go task and resting-state in 90, 4–8-year-old children. The mean amplitude of the ERN was quantified during the − 64 to 108 millisecond (ms) period of time relative to error commission, which was determined by data-driven microstate segmentation of error-related activity. We found that greater magnitude of the ERN associated with greater global explained variance (GEV; i.e., the percentage of total variance in the data explained by a given microstate) of an error-related microstate observed during the same − 64 to 108 ms period (i.e., error-related microstate 3), and to greater parent-report-measured anxiety risk. During resting-state, six data-driven microstates were identified. Both greater magnitude of the ERN and greater GEV values of error-related microstate 3 associated with greater GEV values of resting-state microstate 4, which showed a frontal-central scalp topography. Source localization results revealed overlap between the underlying neural generators of error-related microstate 3 and resting-state microstate 4 and canonical brain networks (e.g., ventral attention) known to support the higher-order cognitive processes involved in error processing. Taken together, our results clarify how individual differences in error-related and intrinsic brain activity are related and enhance our understanding of developing brain network function and organization supporting error processing during early childhood.
format Online
Article
Text
id pubmed-10187414
institution National Center for Biotechnology Information
language English
publishDate 2023
publisher American Journal Experts
record_format MEDLINE/PubMed
spelling pubmed-101874142023-05-17 Exploring the association between EEG microstates during resting-state and error-related activity in young children Bagdasarov, Armen Roberts, Kenneth Brunet, Denis Michel, Christoph M. Gaffrey, Michael S. Res Sq Article The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error processing during early childhood is unclear. We examined the relationship between the ERN and EEG microstates – whole-brain patterns of dynamically evolving scalp potential topographies that reflect periods of synchronized neural activity – during both a go/no-go task and resting-state in 90, 4–8-year-old children. The mean amplitude of the ERN was quantified during the − 64 to 108 millisecond (ms) period of time relative to error commission, which was determined by data-driven microstate segmentation of error-related activity. We found that greater magnitude of the ERN associated with greater global explained variance (GEV; i.e., the percentage of total variance in the data explained by a given microstate) of an error-related microstate observed during the same − 64 to 108 ms period (i.e., error-related microstate 3), and to greater parent-report-measured anxiety risk. During resting-state, six data-driven microstates were identified. Both greater magnitude of the ERN and greater GEV values of error-related microstate 3 associated with greater GEV values of resting-state microstate 4, which showed a frontal-central scalp topography. Source localization results revealed overlap between the underlying neural generators of error-related microstate 3 and resting-state microstate 4 and canonical brain networks (e.g., ventral attention) known to support the higher-order cognitive processes involved in error processing. Taken together, our results clarify how individual differences in error-related and intrinsic brain activity are related and enhance our understanding of developing brain network function and organization supporting error processing during early childhood. American Journal Experts 2023-05-02 /pmc/articles/PMC10187414/ /pubmed/37205415 http://dx.doi.org/10.21203/rs.3.rs-2865543/v1 Text en https://creativecommons.org/licenses/by/4.0/This work is licensed under a Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0/) , which allows reusers to distribute, remix, adapt, and build upon the material in any medium or format, so long as attribution is given to the creator. The license allows for commercial use. https://creativecommons.org/licenses/by/4.0/License: This work is licensed under a Creative Commons Attribution 4.0 International License. Read Full License (https://creativecommons.org/licenses/by/4.0/)
spellingShingle Article
Bagdasarov, Armen
Roberts, Kenneth
Brunet, Denis
Michel, Christoph M.
Gaffrey, Michael S.
Exploring the association between EEG microstates during resting-state and error-related activity in young children
title Exploring the association between EEG microstates during resting-state and error-related activity in young children
title_full Exploring the association between EEG microstates during resting-state and error-related activity in young children
title_fullStr Exploring the association between EEG microstates during resting-state and error-related activity in young children
title_full_unstemmed Exploring the association between EEG microstates during resting-state and error-related activity in young children
title_short Exploring the association between EEG microstates during resting-state and error-related activity in young children
title_sort exploring the association between eeg microstates during resting-state and error-related activity in young children
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10187414/
https://www.ncbi.nlm.nih.gov/pubmed/37205415
http://dx.doi.org/10.21203/rs.3.rs-2865543/v1
work_keys_str_mv AT bagdasarovarmen exploringtheassociationbetweeneegmicrostatesduringrestingstateanderrorrelatedactivityinyoungchildren
AT robertskenneth exploringtheassociationbetweeneegmicrostatesduringrestingstateanderrorrelatedactivityinyoungchildren
AT brunetdenis exploringtheassociationbetweeneegmicrostatesduringrestingstateanderrorrelatedactivityinyoungchildren
AT michelchristophm exploringtheassociationbetweeneegmicrostatesduringrestingstateanderrorrelatedactivityinyoungchildren
AT gaffreymichaels exploringtheassociationbetweeneegmicrostatesduringrestingstateanderrorrelatedactivityinyoungchildren