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Exploring the association between EEG microstates during resting-state and error-related activity in young children
The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error proc...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Journal Experts
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10187414/ https://www.ncbi.nlm.nih.gov/pubmed/37205415 http://dx.doi.org/10.21203/rs.3.rs-2865543/v1 |
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author | Bagdasarov, Armen Roberts, Kenneth Brunet, Denis Michel, Christoph M. Gaffrey, Michael S. |
author_facet | Bagdasarov, Armen Roberts, Kenneth Brunet, Denis Michel, Christoph M. Gaffrey, Michael S. |
author_sort | Bagdasarov, Armen |
collection | PubMed |
description | The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error processing during early childhood is unclear. We examined the relationship between the ERN and EEG microstates – whole-brain patterns of dynamically evolving scalp potential topographies that reflect periods of synchronized neural activity – during both a go/no-go task and resting-state in 90, 4–8-year-old children. The mean amplitude of the ERN was quantified during the − 64 to 108 millisecond (ms) period of time relative to error commission, which was determined by data-driven microstate segmentation of error-related activity. We found that greater magnitude of the ERN associated with greater global explained variance (GEV; i.e., the percentage of total variance in the data explained by a given microstate) of an error-related microstate observed during the same − 64 to 108 ms period (i.e., error-related microstate 3), and to greater parent-report-measured anxiety risk. During resting-state, six data-driven microstates were identified. Both greater magnitude of the ERN and greater GEV values of error-related microstate 3 associated with greater GEV values of resting-state microstate 4, which showed a frontal-central scalp topography. Source localization results revealed overlap between the underlying neural generators of error-related microstate 3 and resting-state microstate 4 and canonical brain networks (e.g., ventral attention) known to support the higher-order cognitive processes involved in error processing. Taken together, our results clarify how individual differences in error-related and intrinsic brain activity are related and enhance our understanding of developing brain network function and organization supporting error processing during early childhood. |
format | Online Article Text |
id | pubmed-10187414 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2023 |
publisher | American Journal Experts |
record_format | MEDLINE/PubMed |
spelling | pubmed-101874142023-05-17 Exploring the association between EEG microstates during resting-state and error-related activity in young children Bagdasarov, Armen Roberts, Kenneth Brunet, Denis Michel, Christoph M. Gaffrey, Michael S. Res Sq Article The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error processing during early childhood is unclear. We examined the relationship between the ERN and EEG microstates – whole-brain patterns of dynamically evolving scalp potential topographies that reflect periods of synchronized neural activity – during both a go/no-go task and resting-state in 90, 4–8-year-old children. The mean amplitude of the ERN was quantified during the − 64 to 108 millisecond (ms) period of time relative to error commission, which was determined by data-driven microstate segmentation of error-related activity. We found that greater magnitude of the ERN associated with greater global explained variance (GEV; i.e., the percentage of total variance in the data explained by a given microstate) of an error-related microstate observed during the same − 64 to 108 ms period (i.e., error-related microstate 3), and to greater parent-report-measured anxiety risk. During resting-state, six data-driven microstates were identified. Both greater magnitude of the ERN and greater GEV values of error-related microstate 3 associated with greater GEV values of resting-state microstate 4, which showed a frontal-central scalp topography. Source localization results revealed overlap between the underlying neural generators of error-related microstate 3 and resting-state microstate 4 and canonical brain networks (e.g., ventral attention) known to support the higher-order cognitive processes involved in error processing. Taken together, our results clarify how individual differences in error-related and intrinsic brain activity are related and enhance our understanding of developing brain network function and organization supporting error processing during early childhood. American Journal Experts 2023-05-02 /pmc/articles/PMC10187414/ /pubmed/37205415 http://dx.doi.org/10.21203/rs.3.rs-2865543/v1 Text en https://creativecommons.org/licenses/by/4.0/This work is licensed under a Creative Commons Attribution 4.0 International License (https://creativecommons.org/licenses/by/4.0/) , which allows reusers to distribute, remix, adapt, and build upon the material in any medium or format, so long as attribution is given to the creator. The license allows for commercial use. https://creativecommons.org/licenses/by/4.0/License: This work is licensed under a Creative Commons Attribution 4.0 International License. Read Full License (https://creativecommons.org/licenses/by/4.0/) |
spellingShingle | Article Bagdasarov, Armen Roberts, Kenneth Brunet, Denis Michel, Christoph M. Gaffrey, Michael S. Exploring the association between EEG microstates during resting-state and error-related activity in young children |
title | Exploring the association between EEG microstates during resting-state and error-related activity in young children |
title_full | Exploring the association between EEG microstates during resting-state and error-related activity in young children |
title_fullStr | Exploring the association between EEG microstates during resting-state and error-related activity in young children |
title_full_unstemmed | Exploring the association between EEG microstates during resting-state and error-related activity in young children |
title_short | Exploring the association between EEG microstates during resting-state and error-related activity in young children |
title_sort | exploring the association between eeg microstates during resting-state and error-related activity in young children |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10187414/ https://www.ncbi.nlm.nih.gov/pubmed/37205415 http://dx.doi.org/10.21203/rs.3.rs-2865543/v1 |
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