Cargando…
Exploring the association between EEG microstates during resting-state and error-related activity in young children
The error-related negativity (ERN) is a negative deflection in the electroencephalography (EEG) waveform at frontal-central scalp sites that occurs after error commission. The relationship between the ERN and broader patterns of brain activity measured across the entire scalp that support error proc...
| Autores principales: | , , , , |
|---|---|
| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
American Journal Experts
2023
|
| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10187414/ https://www.ncbi.nlm.nih.gov/pubmed/37205415 http://dx.doi.org/10.21203/rs.3.rs-2865543/v1 |