An Investigation of the Non-selective Etching of Synthetic Polymers by Electrospray Droplet Impact/Secondary Ion Mass Spectrometry (EDI/SIMS)

Among the various types of cluster secondary ion mass spectrometry (SIMS), electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) is unique due to its high ionization efficiency and non-selective atomic/molecular-level surface etching ability. In this study, EDI/SIMS was applied to t...

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Detalles Bibliográficos
Autores principales: Hiraoka, Kenzo, Sakai, Yuji, Kubota, Hiroyuki, Ninomiya, Satoshi, Rankin-Turner, Stephanie
Formato: Online Artículo Texto
Lenguaje:English
Publicado: The Mass Spectrometry Society of Japan 2023
Materias:
Original Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10209658/
https://www.ncbi.nlm.nih.gov/pubmed/37250594
http://dx.doi.org/10.5702/massspectrometry.A0114

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10209658/
https://www.ncbi.nlm.nih.gov/pubmed/37250594
http://dx.doi.org/10.5702/massspectrometry.A0114

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