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Advanced Algorithm for Reliable Quantification of the Geometry and Printability of Printed Patterns
In nanoparticle-based printed electronic devices, the printability of the patterns constituting the device are crucial factors. Although many studies have investigated the printability of patterns, only a few have analyzed and established international standards for measuring the dimensions and prin...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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MDPI
2023
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10221401/ https://www.ncbi.nlm.nih.gov/pubmed/37242014 http://dx.doi.org/10.3390/nano13101597 |