Performance Degradation Modeling and Its Prediction Algorithm of an IGBT Gate Oxide Layer Based on a CNN-LSTM Network

The problem of health status prediction of insulated-gate bipolar transistors (IGBTs) has gained significant attention in the field of health management of power electronic equipment. The performance degradation of the IGBT gate oxide layer is one of the most important failure modes. In view of fail...

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Detalles Bibliográficos
Autores principales: Wang, Xin, Zhou, Zhenwei, He, Shilie, Liu, Junbin, Cui, Wei
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2023
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10222765/
https://www.ncbi.nlm.nih.gov/pubmed/37241583
http://dx.doi.org/10.3390/mi14050959

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10222765/
https://www.ncbi.nlm.nih.gov/pubmed/37241583
http://dx.doi.org/10.3390/mi14050959

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