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Performance Degradation Modeling and Its Prediction Algorithm of an IGBT Gate Oxide Layer Based on a CNN-LSTM Network
The problem of health status prediction of insulated-gate bipolar transistors (IGBTs) has gained significant attention in the field of health management of power electronic equipment. The performance degradation of the IGBT gate oxide layer is one of the most important failure modes. In view of fail...
| Autores principales: | , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2023
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10222765/ https://www.ncbi.nlm.nih.gov/pubmed/37241583 http://dx.doi.org/10.3390/mi14050959 |