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Structural Analysis of Mo Thin Films on Sapphire Substrates for Epitaxial Growth of AlN
Aluminum nitride (AlN) thin film/molybdenum (Mo) electrode structures are typically required in microelectromechanical system applications. However, the growth of highly crystalline and c-axis-oriented AlN thin films on Mo electrodes remains challenging. In this study, we demonstrate the epitaxial g...
Autores principales: | Kim, Jihong, Kim, Youngil, Hong, Sung-Min |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2023
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10222929/ https://www.ncbi.nlm.nih.gov/pubmed/37241589 http://dx.doi.org/10.3390/mi14050966 |
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